Obálka

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Podrobná bibliografie
Médium: Kniha
Jazyk:angličtina
Témata:
Diffraction patterns
Image processing
Interferometry
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MU Engineering Library General Collection

Informace o exemplářích z: MU Engineering Library General Collection
Signatura: ENGR QC415 .I49 1993
Jednotka 0 AVAILABLE
Poznámky:
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