Kansikuva

Summary goes here

Tallennettuna:
Bibliografiset tiedot
Aineistotyyppi: Kirja
Kieli:englanti
Aiheet:
Diffraction patterns
Image processing
Interferometry
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MU Engineering Library - Temporarily stored offsite - Place Request

Saatavuus: MU Engineering Library - Temporarily stored offsite - Place Request
Hyllypaikka: ENGR QC415 .I49 1993
Nide 0 AVAILABLE
Huomautukset:
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