Obálka

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Podrobná bibliografie
Médium: Kniha
Jazyk:angličtina
Témata:
Breakdown (Electricity)
Dielectrics.
Hafnium oxide.
Integrated circuits
Metal oxide semiconductor field-effect transistors.
Semiconductors
Tagy: Přidat tag
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MU Engineering Library - Temporarily stored offsite - Place Request

Informace o exemplářích z: MU Engineering Library - Temporarily stored offsite - Place Request
Signatura: ENGR QC585.75.H34 K56 2005
Jednotka 0 AVAILABLE
Poznámky:
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