Azala

Summary goes here

Gorde:
Xehetasun bibliografikoak
Formatua: Liburua
Hizkuntza:ingelesa
Gaiak:
Beam steering.
Characterization.
Diffraction.
Nondestructive tests.
Phased arrays.
Refraction.
Scattering.
Etiketak: Etiketa erantsi
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MU Ellis Government Documents: Federal Documents Microfiche

Aleari buruzko argibideak MU Ellis Government Documents: Federal Documents Microfiche
Sailkapena: DOCS-MF NAS 1.26:206092
Alea 0 AVAILABLE
Oharrak:
  • json {"id":"4fd5e3e7-9271-5d92-bb0e-fdf6eab1676f","status":{"code":"AVAILABLE"},"location":{"code":"CGDMF","name":"MU Ellis Government Documents: Federal Documents Microfiche"},"barcode":".i71002613","callNumber":"DOCS-MF NAS 1.26:206092","hostLmsCode":"UMSYS","sourceHostLmsCode":"UMSYS","owningContext":"UMSYS","isRequestable":false,"isSuppressed":false,"holdCount":0,"availabilityDate":"2026-02-07T01:17:16.546948159Z","localItemType":"Microform","canonicalItemType":"NONCIRC","localItemTypeCode":"Microform","agency":{"code":"6mrln","name":"University of Missouri Library System","description":"University of Missouri Library System"},"statusCorrectAsOf":"2026-02-07T01:17:16.766297932Z"}