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Summary goes here

保存先:
書誌詳細
フォーマット: 図書
言語:英語
主題:
Ellipsometry.
Germanium compounds.
Silicon compounds.
Spectroscopic analysis.
Strain measurement.
Superlattices.
Thickness.
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MU Ellis Government Documents: Federal Documents Microfiche

予約･返却請求 MU Ellis Government Documents: Federal Documents Microfiche
請求記号: DOCS-MF NAS 1.15:111685
所蔵 0 AVAILABLE
注記:
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Missouri S&T GovDoc Microfiche (3rd Floor - Media Room)

予約･返却請求 Missouri S&T GovDoc Microfiche (3rd Floor - Media Room)
請求記号: NAS 1.15:111685
所蔵 1 AVAILABLE
注記:
  • json {"id":"63a4a1f6-74d7-528f-9b14-52edff7a5349","status":{"code":"AVAILABLE"},"location":{"code":"RGMICRO","name":"Missouri S&T GovDoc Microfiche (3rd Floor - Media Room)"},"barcode":"050-107369865","callNumber":"NAS 1.15:111685","hostLmsCode":"UMSYS","sourceHostLmsCode":"UMSYS","owningContext":"UMSYS","isRequestable":false,"isSuppressed":false,"holdCount":0,"availabilityDate":"2026-02-10T18:12:03.567605302Z","localItemType":"Microfiche","canonicalItemType":"NONCIRC","localItemTypeCode":"Microfiche","agency":{"code":"6mrln","name":"University of Missouri Library System","description":"University of Missouri Library System"},"statusCorrectAsOf":"2026-02-10T18:12:08.093661072Z"}