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Kaydedildi:
| Materyal Türü: | Kitap |
|---|---|
| Dil: | İngilizce |
| Konular: | |
| Etiketler: |
Etiketle
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| era | |
|---|---|
| format | Book |
| genre | |
| geographic | |
| id | a737d788-e483-4296-bf9b-314f516ca29a |
| isbn | |
| issn | |
| language | eng |
| physical | 1 volume |
| publication | – publisher: National Aeronautics and Space Administration dateOfPublication: 1996 |
| publishDate | 1996 |
| subjects | |
| title | Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry A.R. Heyd [and others]. [microform] / |
| topic | Ellipsometry. Germanium compounds. Silicon compounds. Spectroscopic analysis. Strain measurement. Superlattices. Thickness. |