(1996). Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry A.R. Heyd [and others]. [microform].
Citazione stile Chigago Style (17a edizione)Characterization of SiGe/Ge Heterostructures and Graded Layers Using Variable Angle Spectroscopic Ellipsometry A.R. Heyd [and Others]. [microform]. 1996.
Citatione MLA (9a ed.)Characterization of SiGe/Ge Heterostructures and Graded Layers Using Variable Angle Spectroscopic Ellipsometry A.R. Heyd [and Others]. [microform]. 1996.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.