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| Format: | Buch |
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| Sprache: | Englisch |
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| format | Book |
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| id | a6aa6b76-5ef7-4e11-9ccc-04fcb7924312 |
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| language | eng |
| physical | xiii, 300 pages :illustrations ;29 cm |
| publication | – publisher: ATFA dateOfPublication: ©1981 |
| publishDate | ©1981 |
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| title | ISTFA 1981 : proceedings : International Symposium for Testing and Failure Analysis - 1981, 19-23 October 1981, Airport Marriott Hotel, Los Angeles, Calif., U.S.A. : dedicated to education and the extension of techniques for failure analysis, screening/testing, diagnostics / sponsored by ISTFA, the International Society for Testing and Failure Analysis. |
| topic | Reliability (Engineering) Semiconductors |