(2000). Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook.
Chicago-viite (17. p.)Characterization of High Tc Materials and Devices by Electron Microscopy / Edited by Nigel D. Browning, Stephen J. Pennycook. 2000.
MLA-viite (9. p.)Characterization of High Tc Materials and Devices by Electron Microscopy / Edited by Nigel D. Browning, Stephen J. Pennycook. 2000.
Varoitus: Nämä viitteet eivät aina ole täysin luotettavia.