APA (7th ed.) Citation

(1990). Simultaneous recording of surface topography and conductance by atomic force microscopy / by Richard H. Deeken, Jr.

Chicago Style (17th ed.) Citation

Simultaneous Recording of Surface Topography and Conductance by Atomic Force Microscopy / by Richard H. Deeken, Jr. 1990.

MLA (9th ed.) Citation

Simultaneous Recording of Surface Topography and Conductance by Atomic Force Microscopy / by Richard H. Deeken, Jr. 1990.

Advarsel: Disse citationer er muligvist ikke 100% nøjagtige.