Staff View: Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation / by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi. [electronic resource] :

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Bibliographic Details
Format:	Book
Language:	English
Subjects:	Measurement. Measuring instruments. Electronics. Mechatronics. Spectrum analysis. Microtechnology. Microelectromechanical systems. Measurement Science and Instrumentation. Electronics and Microelectronics, Instrumentation. Spectroscopy. Microsystems and MEMS.
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format	Book
genre
geographic
id	7680867b-9a3a-4ec6-a2b7-e3d87b752738
isbn	9783031442339
issn
language	eng
physical	XXIV, 366 p. 138 illus., 125 illus. in color.online resource.
publication	– publisher: Springer International Publishing dateOfPublication: 2024
publishDate	2024
subjects
title	Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation / by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi. [electronic resource] :
topic	Measurement. Measuring instruments. Electronics. Mechatronics. Spectrum analysis. Microtechnology. Microelectromechanical systems. Measurement Science and Instrumentation. Electronics and Microelectronics, Instrumentation. Mechatronics. Spectroscopy. Microsystems and MEMS.