APA (7e ed.) Bronvermelding

(1988). Preparation and certification of SRM-2530, ellipsometric parameters delta and psi and derived thickness and refractive index of a silicon dioxide layer on silicon G.A. Candela [and others]. [microform].

Chicago (17e ed.) Bronvermelding

Preparation and Certification of SRM-2530, Ellipsometric Parameters Delta and Psi and Derived Thickness and Refractive Index of a Silicon Dioxide Layer on Silicon G.A. Candela [and Others]. [microform]. 1988.

MLA (9e ed.) Bronvermelding

Preparation and Certification of SRM-2530, Ellipsometric Parameters Delta and Psi and Derived Thickness and Refractive Index of a Silicon Dioxide Layer on Silicon G.A. Candela [and Others]. [microform]. 1988.