Citazione Stile APA (7a Edizione)

(1988). Preparation and certification of SRM-2530, ellipsometric parameters delta and psi and derived thickness and refractive index of a silicon dioxide layer on silicon G.A. Candela [and others]. [microform].

Citazione stile Chigago Style (17a edizione)

Preparation and Certification of SRM-2530, Ellipsometric Parameters Delta and Psi and Derived Thickness and Refractive Index of a Silicon Dioxide Layer on Silicon G.A. Candela [and Others]. [microform]. 1988.

Citatione MLA (9a ed.)

Preparation and Certification of SRM-2530, Ellipsometric Parameters Delta and Psi and Derived Thickness and Refractive Index of a Silicon Dioxide Layer on Silicon G.A. Candela [and Others]. [microform]. 1988.