(2014). Fringe pattern analysis for optical metrology: Theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
Chicago Style (17th ed.) CitationFringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. 2014.
MLA (9th ed.) CitationFringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. 2014.
Warning: These citations may not always be 100% accurate.